Charge pattern writing on ZnO microribbon using conductive AFM tips
Abstract
Patterns were imprinted on the surface of ZnO ribbons on highly oriented polycrystalline graphite (HOPG) using conductive AFM cantilever tip. The patterns were imaged under Kelvin probe force microscopy (KPFM). As- grown ZnO ribbons and annealed samples at 600, 700, 800 and 900 were used for pattern imprinting. Patterns were written different samples except on 600 ̊C annealed samples. Charge accumulation caused the work function of the ZnO ribbon surface to alter.