Growth of Indium Oxide on Silicon (100) substrates via direct thermal oxidation
Abstract
Indium oxide (In2O3) was grown from AuIn thin films on Silicon (Si) (100) substrates via direct thermal oxidation technique. The morphology of the product material was varied by changing the rate of sample cooling after the oxidation stage at 550°C. Pyramidal nanostructures and rod-like nanostructures were grown from the
slowly-cooled sample while film-like morphology was achieved by quenching the sample.
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Published
2012-10-22
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Section
Condensed Matter Physics
How to Cite
[1]
“Growth of Indium Oxide on Silicon (100) substrates via direct thermal oxidation”, Proc. SPP, vol. 30, no. 1, pp. SPP2012–6A, Oct. 2012, Accessed: Apr. 16, 2026. [Online]. Available: https://proceedings.spp-online.org/article/view/SPP2012-6A-3








