Comparison of the carrier lifetimes of molecular beam epitaxy grown InxGa1−xAs/GaAs multi-quantum wells with different barrier heights
Abstract
Two indium gallium arsenide InxGa1−x As/gallium arsenide (GaAs) multi-quantum wells (MQW) were grown via molecular beam epitaxy with indium mole fractions of 0.166 (MQW 412) and 0.154 (MQW 417). Then, optical pump terahertz probe (OPTP) spectroscopy was performed to investigate the carrier dynamics in InxGa1−x As/GaAs MQWs. From the OPTP measurements, the decay of the photoexcited carriers in the samples was generated. The MQW 412 and 417 well carrier lifetimes were calculated to be τMQW 412 = 256 ps and τMQW 417 = 158 ps, respectively. Moreover, the carrier lifetime of the MQW is influenced by the barrier height wherein a higher barrier height leads to a longer carrier lifetime.