Low temperature scanning tunneling microscopy and spectroscopy of undoped LT-GaAs
Abstract
We report for the first time on the scanning tunneling microscopy (STM) and spectroscopy (STS) of undoped low temperature grown GaAs (LT-GaAs) measured at 4.7 K. The high resistivity of the LT-GaAs layer was compensated by growing it on top of a (100) n+-GaAs substrate due to the carrier injection at the interface. LT-GaAs was shown to have p-type conductivity based on the STS spectrum. Stable imaging is achieved at a sample bias of -2.5 V.
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Article ID
SPP-2018-PA-08
Section
Poster Session A (Materials Science, Instrumentation, and Photonics)
Published
2018-05-24
How to Cite
[1]
MH Balgos, EA Prieto, R Jaculbia, E Estacio, A Salvador, Y Kim, N Hayazawa, and A Somintac, Low temperature scanning tunneling microscopy and spectroscopy of undoped LT-GaAs, Proceedings of the Samahang Pisika ng Pilipinas 36, SPP-2018-PA-08 (2018). URL: https://proceedings.spp-online.org/article/view/SPP-2018-PA-08.