Low temperature scanning tunneling microscopy and spectroscopy of undoped LT-GaAs
Abstract
We report for the first time on the scanning tunneling microscopy (STM) and spectroscopy (STS) of undoped low temperature grown GaAs (LT-GaAs) measured at 4.7 K. The high resistivity of the LT-GaAs layer was compensated by growing it on top of a (100) n+-GaAs substrate due to the carrier injection at the interface. LT-GaAs was shown to have p-type conductivity based on the STS spectrum. Stable imaging is achieved at a sample bias of -2.5 V.
Downloads
Published
2018-05-24
Issue
Section
Poster Session A (Materials Science, Instrumentation, and Photonics)
How to Cite
[1]
“Low temperature scanning tunneling microscopy and spectroscopy of undoped LT-GaAs”, Proc. SPP, vol. 36, no. 1, p. SPP-2018-PA-08, May 2018, Accessed: Apr. 10, 2026. [Online]. Available: https://proceedings.spp-online.org/article/view/SPP-2018-PA-08








