Electrical characterizations of Zn-doped CuO thin films synthesized using spray pyrolysis deposition
Abstract
In this study, the electrical and crystalline properties of undoped and Zn-doped Copper oxide thin film were measured. The thin film was deposited on p-type silicon (100) substrate via spray pyrolysis, and the presence of pure CuO phase was revealed in x-ray diffraction patterns. Using non-illuminated I-V curve, an Ohmic behavior was observed in undoped and in 1% Zn-doped CuO film, while Schottky behavior was observed on 3% Zn-doped CuO film. Hall measurement was conducted to determine the conductivity, conduction type carrier mobility, and carrier concentration. Notable transformation of CuO from p-type to n-type for increasing Zn-dopant concentration was observed.
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Physics at the front and center: Strengthening core values in physics research
18–21 August 2016, University of the Philippines Visayas, Iloilo City
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