Electrical characterizations of Zn-doped CuO thin films synthesized using spray pyrolysis deposition

Authors

  • Ar Jay Sura National Institute of Physics, University of the Philippines Diliman
  • Maria Cecilia Angub National Institute of Physics, University of the Philippines Diliman
  • Lorenzo Lopez, Jr. National Institute of Physics, University of the Philippines Diliman
  • Joybelle Lopez National Institute of Physics, University of the Philippines Diliman
  • Anthony Tuico National Institute of Physics, University of the Philippines Diliman
  • Arven Cafe National Institute of Physics, University of the Philippines Diliman
  • Armando Somintac National Institute of Physics, University of the Philippines Diliman

Abstract

In this study, the electrical and crystalline properties of undoped and Zn-doped Copper oxide thin film were measured. The thin film was deposited on p-type silicon (100) substrate via spray pyrolysis, and the presence of pure CuO phase was revealed in x-ray diffraction patterns. Using non-illuminated I-V curve, an Ohmic behavior was observed in undoped and in 1% Zn-doped CuO film, while Schottky behavior was observed on 3% Zn-doped CuO film. Hall measurement was conducted to determine the conductivity, conduction type carrier mobility, and carrier concentration. Notable transformation of CuO from p-type to n-type for increasing Zn-dopant concentration was observed.

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Published

2016-08-18

How to Cite

[1]
“Electrical characterizations of Zn-doped CuO thin films synthesized using spray pyrolysis deposition”, Proc. SPP, vol. 34, no. 1, p. SPP-2016-PB-12, Aug. 2016, Accessed: Mar. 24, 2026. [Online]. Available: https://proceedings.spp-online.org/article/view/SPP-2016-PB-12