Thermal sensing application of aluminum nitride thin film

Authors

  • Vernalyn Copa Materials Science and Engineering Program, University of the Philippines Diliman
  • Anthony Tuico Materials Science and Engineering Program, University of the Philippines Diliman
  • Erick John Carlo Solibet National Institute of Physics, University of the Philippines Diliman
  • Elmer Estacio National Institute of Physics, University of the Philippines Diliman
  • Arnel Salvador National Institute of Physics, University of the Philippines Diliman
  • Armando Somintac National Institute of Physics, University of the Philippines Diliman

Abstract

Aluminum nitride (AlN) thin film is fabricated into a serpentine-structured thermal sensor. The fabricated sensor has a working area of 40mm x 40mm, with a thickness of 592 nm for the AlN sensing element. The sensing application of the device was tested in the range of 30°C to 100°C. The obtained proportionality constant, β, was found to have a 60/K deviation in the entire characterization range. The device was found to have better sensitivity, at -1.43%/K, in the lowest change in temperature measurement. β-equation was used as calibration equation in this study.

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Published

2016-08-18

How to Cite

[1]
“Thermal sensing application of aluminum nitride thin film”, Proc. SPP, vol. 34, no. 1, p. SPP-2016-PB-07, Aug. 2016, Accessed: Mar. 28, 2026. [Online]. Available: https://proceedings.spp-online.org/article/view/SPP-2016-PB-07