Thermal sensing application of aluminum nitride thin film
Abstract
Aluminum nitride (AlN) thin film is fabricated into a serpentine-structured thermal sensor. The fabricated sensor has a working area of 40mm x 40mm, with a thickness of 592 nm for the AlN sensing element. The sensing application of the device was tested in the range of 30°C to 100°C. The obtained proportionality constant, β, was found to have a 60/K deviation in the entire characterization range. The device was found to have better sensitivity, at -1.43%/K, in the lowest change in temperature measurement. β-equation was used as calibration equation in this study.