Electrical and structural properties of Cu_xO film at varying annealing temperatures

Authors

Luce Vida A. Sayson ⋅ PH Materials Science and Engineering Program, University of the Philippines Diliman
Horace Andrew F. Husay ⋅ PH National Institute of Physics, University of the Philippines Diliman
Maria Cecilia M. Angub ⋅ PH Materials Science and Engineering Program, University of the Philippines Diliman
Armando S. Somintac ⋅ PH National Institute of Physics, University of the Philippines Diliman

Abstract

Copper oxide thin films were deposited on glass substrates using spray pyrolysis technique and were subsequently annealed at 160°C and 400°C for two hours. The effects of annealing on the structural and electrical properties of the films were investigated using X-ray diffraction (XRD) and Hall effect measurements. XRD pattern of the films revealed the formation of single phase cupric oxide for un-annealed sample, while intensified diffraction peaks and decreased FWHM were observed for annealed samples attributed to increased crystallinity. Hall effect measurements showed that the deposited films exhibited p-type conductivity. Increased mobility and decreased in resistivity leads to enhancement of conductivity at elevated temperatures.

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Issue

2016: Proceedings of the 34th Samahang Pisika ng Pilipinas Physics Conference

Article ID

SPP-2016-PA-10

Section

Poster Session PA

Published

2016-08-18

How to Cite

[1]

LVA Sayson, HAF Husay, MCM Angub, and AS Somintac, Electrical and structural properties of CuxO film at varying annealing temperatures, Proceedings of the Samahang Pisika ng Pilipinas 34, SPP-2016-PA-10 (2016). URL: https://proceedings.spp-online.org/article/view/SPP-2016-PA-10.