Characterization of undoped and copper-doped zinc oxide thin films deposited via spray pyrolysis
Abstract
Undoped and copper-doped zinc oxide thin films were deposited via spray pyrolysis. Based on their x-ray diffraction pattern, the deposited films exhibit hexagonal wurtzite crystal. From the transmittance data, optical band gap of the films was computed using Tauc relation. Upon doping with copper, band gap of zinc oxide decreases from 3.26 eV to 3.17 eV which indicates that copper atom is located at the substitutional sites of the zinc oxide lattice. The relatively lower reflectance of copper-doped zinc oxide is attributed to its poor crystallinity that resulted to higher absorbance. As such, the copper-doped zinc oxide can be used as an antireflection coating material for optoelectronic devices.