Terahertz emission from Cu2O/PSi with Fabry-Perot mode at 800 nm

Authors

  • Joybelle M. Lopez ⋅ PH National Institute of Physics, University of the Philippines Diliman
  • Arven I. Cafe ⋅ PH National Institute of Physics, University of the Philippines Diliman
  • Horace Andrew F. Husay ⋅ PH National Institute of Physics, University of the Philippines Diliman
  • Lorenzo P. Lopez, Jr. ⋅ PH Materials Science Engineering Program, University of the Philippines Diliman
  • Arnel A. Salvador ⋅ PH National Institute of Physics, University of the Philippines Diliman
  • Elmer S. Estacio ⋅ PH National Institute of Physics, University of the Philippines Diliman
  • Armando S. Somintac ⋅ PH National Institute of Physics, University of the Philippines Diliman

Abstract

We report on the terahertz (THz) emission of tuned Fabry-Perot mode at 800nm from PSi deposited with Cu2O thin film. PSi filmwas fabricated via electrochemical etching of highly doped p-type silicon. Porosity was measured using Reflectance spectroscopy. Cuprous Oxide(Cu2O) was deposited on the PSi via chemical bath deposition using Copper sulfate solution. The Fabry-Perot mode at 800nm was tuned by controlling the thickness of the Cu2O film. The most intense THz-TDS came from Cu2O/PSi sample with the maximum absorption at 800nm as shown in the reflectance results.

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Published

2016-08-18

How to Cite

[1]
“Terahertz emission from Cu2O/PSi with Fabry-Perot mode at 800 nm”, Proc. SPP, vol. 34, no. 1, pp. SPP–2016, Aug. 2016, Accessed: Apr. 02, 2026. [Online]. Available: https://proceedings.spp-online.org/article/view/SPP-2016-2A-06