Self-consistent simulation of a δ-doped pseudomorphic high electron transistor (pHEMT) via a semi-analytical technique
Abstract
This paper describes the self-consistent calculation of the energy levels and eigenstates of a delta-doped pHEMT structure via a semi-analytical technique. To test the method, it is used to simulate a GaAs/InGaAs/GaAs pHEMT. Resulting calculated sheet channel concentration data versus spacer layer thickness show agreement with the reference experimental data.
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Scouting the grand vista: From curiosity-driven research to real world application
28-30 October 2009, Development Academy of the Philippines Convention Center, Tagaytay City