Fabrication of Si nanopillars via Ni-nanoclusters and reactive ion etching

Authors

  • Rhona Olivia M. Gonzales National Institute of Physics, University of the Philippines Diliman
  • Rengie Mark D. Mailig National Institute of Physics, University of the Philippines Diliman
  • Ramon M. delos Santos National Institute of Physics, University of the Philippines Diliman
  • Jeremy G. Porquez National Institute of Physics, University of the Philippines Diliman
  • Jorge Michael M. Presto National Institute of Physics, University of the Philippines Diliman
  • Arnel A. Salvador National Institute of Physics, University of the Philippines Diliman
  • Armando S. Somintac National Institute of Physics, University of the Philippines Diliman

Abstract

Silicon nanopillars with height of 1100 nm and width of 300 nm were fabricated using Ni-nanoclusters as masks. The Ni film was deposited via e beam evaporation. Nanoclusters with average size of 100 nm were achieved by annealing at various times. The effects of different parameters like gas flow rate and Ni mask size on anisotropy and aspect ratio of the pillars were investigated.

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Issue

Article ID

SPP-2008-PA-26

Section

Poster Session A (Materials, Optical, and Plasma Physics)

Published

2008-10-22

How to Cite

[1]
ROM Gonzales, RMD Mailig, RM delos Santos, JG Porquez, JMM Presto, AA Salvador, and AS Somintac, Fabrication of Si nanopillars via Ni-nanoclusters and reactive ion etching, Proceedings of the Samahang Pisika ng Pilipinas 26, SPP-2008-PA-26 (2008). URL: https://proceedings.spp-online.org/article/view/SPP-2008-PA-26.