Fabrication of Si nanopillars via Ni-nanoclusters and reactive ion etching
Abstract
Silicon nanopillars with height of 1100 nm and width of 300 nm were fabricated using Ni-nanoclusters as masks. The Ni film was deposited via e beam evaporation. Nanoclusters with average size of 100 nm were achieved by annealing at various times. The effects of different parameters like gas flow rate and Ni mask size on anisotropy and aspect ratio of the pillars were investigated.
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Article ID
SPP-2008-PA-26
Section
Poster Session A (Materials, Optical, and Plasma Physics)
Published
2008-10-22
How to Cite
[1]
ROM Gonzales, RMD Mailig, RM delos Santos, JG Porquez, JMM Presto, AA Salvador, and AS Somintac, Fabrication of Si nanopillars via Ni-nanoclusters and reactive ion etching, Proceedings of the Samahang Pisika ng Pilipinas 26, SPP-2008-PA-26 (2008). URL: https://proceedings.spp-online.org/article/view/SPP-2008-PA-26.