Gold electrochemical plating process using sulfite based electrolyte for semiconductor device fabrication
Abstract
We demonstrate the gold electrochemical plating process incorporated in the fabrication of semiconductor devices like inductors, capacitors and transistors necessary for RF applications. The average plating rate of our Au-electrochemical plating set-up is around 25.77x106 μm/[(A/μm2)s]. We have successfully plated thick contact pads for capacitors and inductors as well as gate metals for transistors. The plated gold metal has a bright color, smooth interface without rabbit ears and cracks and consistent with the calculated plating rate.