Production of nanodot structure in silicon (100) substrate by low energy reactive ion bombardment
Abstract
We present result on the formation of nanodot structures on a silicon substrate by reactive ion bombardment. Reactive ions and radicals are produced using a low energy gas discharge ion source (GDIS) plasma device. Sizes of the dots formed are in the range [30-300] nm. These are comparable to the results produced via argon ion sputtering.
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Article ID
SPP-2008-2A-03
Section
Materials Physics
Published
2008-10-22
How to Cite
[1]
A Flores, G Malapit, R Loberternos, G Blantocas, and H Ramos, Production of nanodot structure in silicon (100) substrate by low energy reactive ion bombardment, Proceedings of the Samahang Pisika ng Pilipinas 26, SPP-2008-2A-03 (2008). URL: https://proceedings.spp-online.org/article/view/SPP-2008-2A-03.