Investigating TiN formation through mapping of sheet plasma using Langmuir probe
Abstract
Langmuir probes with straight and L-shaped tips were used in weakly ionized Ar and N2-Ar sheet plasma to determine electron density and temperature at localized positions. Results show that electron distribution and temperature are not uniformly distributed through out the sheet. The experimental data can be used in mapping the sheet plasma to locate optimum deposition.
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Published
2007-10-24
Issue
Section
Poster Session PB
How to Cite
[1]
“Investigating TiN formation through mapping of sheet plasma using Langmuir probe”, Proc. SPP, vol. 25, no. 1, p. SPP-2007-PB-17, Oct. 2007, Accessed: May 02, 2026. [Online]. Available: https://proceedings.spp-online.org/article/view/SPP-2007-PB-17








