Design and implementation of a low-cost thermoreflectance microscope
Abstract
We design a low cost and fast scanning thermal imaging system and demonstrate its capability in the investigation of temperature variation in an active integrated circuit (IC). The design is able to map the variation of temperature via changes in reflectivity, and to localize heating or cooling spots within the IC using multi-wavelength reflectance measurement at 10.9 nm effective spectral resolution.
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Article ID
SPP-2005-3D-02
Section
Instrumentation and Optics
Published
2005-10-26
How to Cite
[1]
S Delica, G Bautista, C Blanca, B Buenaobra, and C Saloma, Design and implementation of a low-cost thermoreflectance microscope, Proceedings of the Samahang Pisika ng Pilipinas 23, SPP-2005-3D-02 (2005). URL: https://proceedings.spp-online.org/article/view/SPP-2005-3D-02.