Nano-scale characterization of single wall carbon nanotube (SWNTs) using tip-enhanced near-field Raman spectroscopy

Authors

  • Taka-aki Yano ⋅ JP Department of Applied Physics, Osaka University
  • Norihiko Hayazawa ⋅ JP Department of Applied Physics, Osaka University and CREST, Japan Corporation of Science and Technology
  • Yasushi Inouye ⋅ JP Department of Applied Physics, Osaka University and CREST, Japan Corporation of Science and Technology and RIKEN, Wakō
  • Satoshi Kawata ⋅ JP Department of Applied Physics, Osaka University and CREST, Japan Corporation of Science and Technology and RIKEN, Wakō

Abstract

We demonstrate nano-scale characterization of single wall carbon nanotubes (SWNTs) using tip-enhanced near-field Raman spectroscopy (TERS). Their diameters and chiralities (n,m) were determined on a nanometer scale from the tip-enhanced Raman spectra of SWNTs.

SPP 2003 Proceedings Cover

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Published

2003-10-22

Issue

2003: Proceedings of the 21st Samahang Pisika ng Pilipinas Physics Congress

Section

Optics and Photonics

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How to Cite

[1]
“Nano-scale characterization of single wall carbon nanotube (SWNTs) using tip-enhanced near-field Raman spectroscopy”, Proc. SPP, vol. 21, no. 1, pp. SPP–2003, Oct. 2003, Accessed: Apr. 30, 2026. [Online]. Available: https://proceedings.spp-online.org/article/view/SPP-2003-3C-01