Nano-scale characterization of single wall carbon nanotube (SWNTs) using tip-enhanced near-field Raman spectroscopy

Authors

Taka-aki Yano Department of Applied Physics, Osaka University
Norihiko Hayazawa Department of Applied Physics, Osaka University and CREST, Japan Corporation of Science and Technology
Yasushi Inouye Department of Applied Physics, Osaka University and CREST, Japan Corporation of Science and Technology and RIKEN, Wako
Satoshi Kawata Department of Applied Physics, Osaka University and CREST, Japan Corporation of Science and Technology and RIKEN, Wako

Abstract

We demonstrate nano-scale characterization of single wall carbon nanotubes (SWNTs) using tip-enhanced near-field Raman spectroscopy (TERS). Their diameters and chiralities (n,m) were determined on a nanometer scale from the tip-enhanced Raman spectra of SWNTs.

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Published

2003-10-22

Issue

2003: Proceedings of the 21st Samahang Pisika ng Pilipinas Physics Congress

Section

Optics and Photonics

License

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How to Cite

[1]

“Nano-scale characterization of single wall carbon nanotube (SWNTs) using tip-enhanced near-field Raman spectroscopy”, Proc. SPP, vol. 21, no. 1, pp. SPP–2003, Oct. 2003, Accessed: Mar. 30, 2026. [Online]. Available: https://proceedings.spp-online.org/article/view/SPP-2003-3C-01