Displacement measurements at diffraction-limited resolution using optical-feedback laser diode Michelson interferometer

Authors

Peter John Rodrigo National Institute of Physics, University of the Philippines Diliman
May Lim National Institute of Physics, University of the Philippines Diliman
Caesar Saloma National Institute of Physics, University of the Philippines Diliman

Abstract

Direction-sensitive displacement measurements at diffraction-limited spatial resolution is demonstrated with an interferometric optical-feedback laser diode confocal imaging system. Magnitude (in the order of wavelength) and direction of line-of-sight displacements of reflecting samples are detected within the depth of field. Comparison between theory and actual instrument performance is presented.

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Issue

2001: Proceedings of the 19th Samahang Pisika ng Pilipinas Philippine Physics Congress

Article ID

SPP-2001-W2A-1

Section

Lasers and Applications

Published

2001-10-24

How to Cite

[1]

PJ Rodrigo, M Lim, and C Saloma, Displacement measurements at diffraction-limited resolution using optical-feedback laser diode Michelson interferometer, Proceedings of the Samahang Pisika ng Pilipinas 19, SPP-2001-W2A-1 (2001). URL: https://proceedings.spp-online.org/article/view/SPP-2001-W2A-1.