Displacement measurements at diffraction-limited resolution using optical-feedback laser diode Michelson interferometer

Authors

  • Peter John Rodrigo ⋅ PH National Institute of Physics, University of the Philippines Diliman
  • May Lim ⋅ PH National Institute of Physics, University of the Philippines Diliman
  • Caesar Saloma ⋅ PH National Institute of Physics, University of the Philippines Diliman

Abstract

Direction-sensitive displacement measurements at diffraction-limited spatial resolution is demonstrated with an interferometric optical-feedback laser diode confocal imaging system. Magnitude (in the order of wavelength) and direction of line-of-sight displacements of reflecting samples are detected within the depth of field. Comparison between theory and actual instrument performance is presented.

SPP 2001 Proceedings Cover

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Published

2001-10-24

Issue

2001: Proceedings of the 19th Samahang Pisika ng Pilipinas Philippine Physics Congress

Section

Lasers and Applications

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How to Cite

[1]
“Displacement measurements at diffraction-limited resolution using optical-feedback laser diode Michelson interferometer”, Proc. SPP, vol. 19, no. 1, pp. SPP-2001-W2A-1, Oct. 2001, Accessed: Apr. 28, 2026. [Online]. Available: https://proceedings.spp-online.org/article/view/SPP-2001-W2A-1