Displacement measurements at diffraction-limited resolution using optical-feedback laser diode Michelson interferometer

Authors

Peter John Rodrigo ⋅ PH National Institute of Physics, University of the Philippines Diliman
May Lim ⋅ PH National Institute of Physics, University of the Philippines Diliman
Caesar Saloma ⋅ PH National Institute of Physics, University of the Philippines Diliman

Abstract

Direction-sensitive displacement measurements at diffraction-limited spatial resolution is demonstrated with an interferometric optical-feedback laser diode confocal imaging system. Magnitude (in the order of wavelength) and direction of line-of-sight displacements of reflecting samples are detected within the depth of field. Comparison between theory and actual instrument performance is presented.

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Issue

2001: Proceedings of the 19th Samahang Pisika ng Pilipinas Philippine Physics Congress

Scaling new heights in physics and physics education
24-26 October 2001, Saint Mary's University, Nueva Vizcaya

Article ID

SPP-2001-W2A-1

Section

Lasers and Applications

Published

2001-10-24

How to Cite

[1]

PJ Rodrigo, M Lim, and C Saloma, Displacement measurements at diffraction-limited resolution using optical-feedback laser diode Michelson interferometer, Proceedings of the Samahang Pisika ng Pilipinas 19, SPP-2001-W2A-1 (2001). URL: https://proceedings.spp-online.org/article/view/SPP-2001-W2A-1.