Image measurement system for JEOL Scanning Electron Microscope 5300 Series

Authors

Ronald C. Macatangay ⋅ PH Physics Department, De La Salle University
Gil Nonato C. Santos ⋅ PH Physics Department, De La Salle University
Reuben V. Quiroga ⋅ PH Physics Department, De La Salle University

Abstract

Measurements in the micrometer scale are essential in the analysis of images taken from scanning electron microscopes. Using geometric optics and C++ programming language, an accurate, low-cost and simple system was produced.

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Issue

2000: Proceedings of the 18th Samahang Pisika ng Pilipinas Physics Congress

Article ID

SPP-2000-IP-01

Section

Instrumentation Physics

Published

2000-10-27

How to Cite

[1]

RC Macatangay, GNC Santos, and RV Quiroga, Image measurement system for JEOL Scanning Electron Microscope 5300 Series, Proceedings of the Samahang Pisika ng Pilipinas 18, SPP-2000-IP-01 (2000). URL: https://proceedings.spp-online.org/article/view/SPP-2000-IP-01.