Image measurement system for JEOL Scanning Electron Microscope 5300 Series

Authors

Ronald C. Macatangay ⋅ PH Physics Department, De La Salle University
Gil Nonato C. Santos ⋅ PH Physics Department, De La Salle University
Reuben V. Quiroga ⋅ PH Physics Department, De La Salle University

Abstract

Measurements in the micrometer scale are essential in the analysis of images taken from scanning electron microscopes. Using geometric optics and C++ programming language, an accurate, low-cost and simple system was produced.

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Published

2000-10-27

Issue

2000: Proceedings of the 18th Samahang Pisika ng Pilipinas Physics Congress

Section

Instrumentation Physics

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How to Cite

[1]

“Image measurement system for JEOL Scanning Electron Microscope 5300 Series”, Proc. SPP, vol. 18, no. 1, p. SPP-2000-IP-01, Oct. 2000, Accessed: Apr. 28, 2026. [Online]. Available: https://proceedings.spp-online.org/article/view/SPP-2000-IP-01