Image measurement system for JEOL Scanning Electron Microscope 5300 Series

Authors

  • Ronald C. Macatangay Physics Department, De La Salle University
  • Gil Nonato C. Santos Physics Department, De La Salle University
  • Reuben V. Quiroga Physics Department, De La Salle University

Abstract

Measurements in the micrometer scale are essential in the analysis of images taken from scanning electron microscopes. Using geometric optics and C++ programming language, an accurate, low-cost and simple system was produced.

Downloads

Issue

Article ID

SPP-2000-IP-01

Section

Instrumentation Physics

Published

2000-10-27

How to Cite

[1]
RC Macatangay, GNC Santos, and RV Quiroga, Image measurement system for JEOL Scanning Electron Microscope 5300 Series, Proceedings of the Samahang Pisika ng Pilipinas 18, SPP-2000-IP-01 (2000). URL: https://proceedings.spp-online.org/article/view/SPP-2000-IP-01.