XRD analysis on the effect of annealing temperature and flux content on the formation of epitaxial YBa₂Cu₃O_7-δ thin films deposited via sedimentation

Authors

Rusty A. Lopez ⋅ PH National Institute of Physics, University of the Philippines Diliman
Jerome C. Taguba ⋅ PH National Institute of Physics, University of the Philippines Diliman
Roland V. Sarmago ⋅ PH National Institute of Physics, University of the Philippines Diliman

Abstract

YBa₂Cu₃O_7-δ thin films were fabricated using sedimentation deposition method on STO (100) substrates. Annealing temperature and flux content were varied to impose epitaxial growth while maintaining phase purity. From XRD data analysis, it was observed that the addition of 15 wt.% KCl to the precursor powder followed by quench annealing at 1010°C for 30 minutes produced highly c-axis oriented films with virtually no phase segregation.

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Issue

2014: Proceedings of the 32nd Samahang Pisika ng Pilipinas Physics Congress

Article ID

SPP2014-PA-11

Section

Poster Session PA

Published

2014-10-17

How to Cite

[1]

RA Lopez, JC Taguba, and RV Sarmago, XRD analysis on the effect of annealing temperature and flux content on the formation of epitaxial YBa2Cu3O7-δ thin films deposited via sedimentation, Proceedings of the Samahang Pisika ng Pilipinas 32, SPP2014-PA-11 (2014). URL: https://proceedings.spp-online.org/article/view/1858.