Structural and morphological properties of Nd:YAG thin films grown on quartz substrate using fs-PLD
Abstract
Growth of Nd:YAG thin films on quartz substrate using fs-PLD was investigated. Thin films were grown for 2, 3 and 4 hours. The effect of varying deposition time to crystalline structure and morphological properties of the film was studied. XRD plot show a preferential growth of (321) YAG phase for all the samples. SEM images reveal cubic shape particles that can be a result of femtosecond laser induced cleaving on the target.
Downloads
Published
2014-10-17
Issue
Section
Condensed Matter Physics
How to Cite
[1]
Structural and morphological properties of Nd:YAG thin films grown on quartz substrate using fs-PLD, Proceedings of the Samahang Pisika ng Pilipinas 32, (2014). URL: https://proceedings.spp-online.org/article/view/1805.



