Structural and morphological properties of Nd:YAG thin films grown on quartz substrate using fs-PLD
Abstract
Growth of Nd:YAG thin films on quartz substrate using fs-PLD was investigated. Thin films were grown for 2, 3 and 4 hours. The effect of varying deposition time to crystalline structure and morphological properties of the film was studied. XRD plot show a preferential growth of (321) YAG phase for all the samples. SEM images reveal cubic shape particles that can be a result of femtosecond laser induced cleaving on the target.
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Towards enhanced physics research and education
17-20 October 2014, University of Philippines Diliman, Quezon City