Structural and morphological properties of Nd:YAG thin films grown on quartz substrate using fs-PLD
Abstract
Growth of Nd:YAG thin films on quartz substrate using fs-PLD was investigated. Thin films were grown for 2, 3 and 4 hours. The effect of varying deposition time to crystalline structure and morphological properties of the film was studied. XRD plot show a preferential growth of (321) YAG phase for all the samples. SEM images reveal cubic shape particles that can be a result of femtosecond laser induced cleaving on the target.
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Published
2014-10-17
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Section
Condensed Matter Physics
How to Cite
[1]
“Structural and morphological properties of Nd:YAG thin films grown on quartz substrate using fs-PLD”, Proc. SPP, vol. 32, no. 1, pp. SPP2014–3A, Oct. 2014, Accessed: Apr. 04, 2026. [Online]. Available: https://proceedings.spp-online.org/article/view/1805








