Structural and morphological properties of Nd:YAG thin films grown on quartz substrate using fs-PLD
Abstract
Growth of Nd:YAG thin films on quartz substrate using fs-PLD was investigated. Thin films were grown for 2, 3 and 4 hours. The effect of varying deposition time to crystalline structure and morphological properties of the film was studied. XRD plot show a preferential growth of (321) YAG phase for all the samples. SEM images reveal cubic shape particles that can be a result of femtosecond laser induced cleaving on the target.
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Published
2014-10-17
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Section
Condensed Matter Physics
How to Cite
[1]
AM Amo, JA De Mesa, AP Lacaba, LL Dasallas, and WO Garcia, Structural and morphological properties of Nd:YAG thin films grown on quartz substrate using fs-PLD, in Proceedings of the 32nd Samahang Pisika ng Pilipinas Physics Congress (Philippines, 2014), SPP2014-3A-06. URL: https://proceedings.spp-online.org/article/view/1805



