Phase dissociation of Bi₂Sr_2−xIn_xCa₁Cu₂O_8+δ thick films fabricated via sedimentation process

Authors

Francesca Isabel N. de Vera ⋅ PH National Institute of Physics, University of the Philippines Diliman
Jonalds L. Tacneng ⋅ PH National Institute of Physics, University of the Philippines Diliman
Xyrus A. Galapia ⋅ PH National Institute of Physics, University of the Philippines Diliman
Carlo A. Arcilla ⋅ PH National Institute of Geological Sciences, University of the Philippines Diliman
Roland V. Sarmago ⋅ PH National Institute of Physics, University of the Philippines Diliman

Abstract

Bi₂Sr_2-xIn_xCaCu₂O_8+δ thick films were fabricated using sedimentation deposition process. SEM micrographs show micro-rods and (Cu and Ca-rich) precipitates formed in the surface of the films which suggests phase decomposition. XRD shows a mixture of Bi-2212 and 2201 phases with increasing Bi-2201 with In content. Highest mobility was obtained for x=0.20 film which has least precipitates and smoother morphology. The most conducting samples were measure for films with high number of Cu-rich precipitates.

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Issue

2015: Proceedings of the 33rd Samahang Pisika ng Pilipinas Physics Congress

Article ID

SPP-2015-PB-13

Section

Poster Session PB

Published

2015-06-03

How to Cite

[1]

FIN de Vera, JL Tacneng, XA Galapia, CA Arcilla, and RV Sarmago, Phase dissociation of Bi2Sr2−xInxCa1Cu2O8+δ thick films fabricated via sedimentation process, Proceedings of the Samahang Pisika ng Pilipinas 33, SPP-2015-PB-13 (2015). URL: https://proceedings.spp-online.org/article/view/1219.