Phase dissociation of Bi2Sr2−xInxCa1Cu2O8+δ thick films fabricated via sedimentation process

Authors

  • Francesca Isabel N. de Vera ⋅ PH National Institute of Physics, University of the Philippines Diliman
  • Jonalds L. Tacneng ⋅ PH National Institute of Physics, University of the Philippines Diliman
  • Xyrus A. Galapia ⋅ PH National Institute of Physics, University of the Philippines Diliman
  • Carlo A. Arcilla ⋅ PH National Institute of Geological Sciences, University of the Philippines Diliman
  • Roland V. Sarmago ⋅ PH National Institute of Physics, University of the Philippines Diliman

Abstract

Bi2Sr2-xInxCaCu2O8+δ thick films were fabricated using sedimentation deposition process. SEM micrographs show micro-rods and (Cu and Ca-rich) precipitates formed in the surface of the films which suggests phase decomposition. XRD shows a mixture of Bi-2212 and 2201 phases with increasing Bi-2201 with In content. Highest mobility was obtained for x=0.20 film which has least precipitates and smoother morphology. The most conducting samples were measure for films with high number of Cu-rich precipitates.

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Published

2015-06-03

Issue

2015: Proceedings of the 33rd Samahang Pisika ng Pilipinas Physics Congress

Section

Poster Session PB

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How to Cite

[1]
“Phase dissociation of Bi2Sr2−xInxCa1Cu2O8+δ thick films fabricated via sedimentation process”, Proc. SPP, vol. 33, no. 1, p. SPP-2015-PB-13, Jun. 2015, Accessed: Apr. 15, 2026. [Online]. Available: https://proceedings.spp-online.org/article/view/1219