Phase dissociation of Bi₂Sr_2−xIn_xCa₁Cu₂O_8+δ thick films fabricated via sedimentation process

Authors

Francesca Isabel N. de Vera National Institute of Physics, University of the Philippines Diliman
Jonalds L. Tacneng National Institute of Physics, University of the Philippines Diliman
Xyrus A. Galapia National Institute of Physics, University of the Philippines Diliman
Carlo A. Arcilla National Institute of Geological Sciences, University of the Philippines Diliman
Roland V. Sarmago National Institute of Physics, University of the Philippines Diliman

Abstract

Bi₂Sr_2-xIn_xCaCu₂O_8+δ thick films were fabricated using sedimentation deposition process. SEM micrographs show micro-rods and (Cu and Ca-rich) precipitates formed in the surface of the films which suggests phase decomposition. XRD shows a mixture of Bi-2212 and 2201 phases with increasing Bi-2201 with In content. Highest mobility was obtained for x=0.20 film which has least precipitates and smoother morphology. The most conducting samples were measure for films with high number of Cu-rich precipitates.

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Issue

2015: Proceedings of the 33rd Samahang Pisika ng Pilipinas Physics Congress

Article ID

SPP-2015-PB-13

Section

Poster Session PB

Published

2015-06-03

How to Cite

[1]

FIN de Vera, JL Tacneng, XA Galapia, CA Arcilla, and RV Sarmago, Phase dissociation of Bi2Sr2−xInxCa1Cu2O8+δ thick films fabricated via sedimentation process, Proceedings of the Samahang Pisika ng Pilipinas 33, SPP-2015-PB-13 (2015). URL: https://proceedings.spp-online.org/article/view/1219.