Surface analysis of n-type silicon after contact electrification using magnetic force microscopy

Abstract

Using Magnetic Force Microscopy (MFM), surface charge analysis of n-type Silicon (100) wafer was undertaken after contact electrification with a cotton swab. Phase image taken from MFM has shown carpet like charge distribution pattern exhibiting both positive and negative electrostatic charge distributions. Upon closer look, spike like image formation were observed on n-type Si surface that correspond to the formation of ions arising from contact electrification.