Textured semi-insulating Gallium Arsenide (100) exhibiting enhanced terahertz emission
Abstract
This study investigates the enhancement of terahertz (THz) emission from textured semi-insulating gallium arsenide (GaAs) (100). Wafers were etched at different etching times to texturize the surface. Reflectance spectroscopy was used to examine the texturization. The THz emission of the sample was investigated using THz time domain spectroscopy. An enhanced THz emission was observed for the sample etched for 30 minutes. Azimuthal angle dependence of the terahertz emission suggests no change in the orientation of the crystal GaAs. Small angle x-ray diffractrometry confirms the crystallinity of the surface is preserved.