Optical analysis of tin oxide thin films synthesized by reactive magnetron sputtering
Abstract
Tin oxide (SnO2) was synthesized on glass substrates via reactive sputtering using a compact planar magnetron. The deposition was done for 15 minutes at varying target bias/current and O2:Ar gas ratio. One sample was deposited on Si(100) and it was verified through x-ray diffraction that SnO2–(101) and (310) were formed. UV-vis spectroscopy results and calculations showed that increasing the target current and O2:Ar ratio correspondingly increases the film thickness. Results also showed higher transmittance and absorbance in the visible and UV spectrum, respectively. Transmittance and absorbance images shone with visible and UV light source are also presented supporting the spectroscopy results.