A novel and simple current-voltage measurement set up
Abstract
A simple design of current-voltage (I-V) measurement system for linear and non-linear electronic devices is proposed in this study. The system consists of a voltage and current sources interfaced to a computer using a Gizduino X microcontroller. It was observed that the accuracy in measuring I-V characteristics improved when the feedback resistance is equal to the resistance of the device under test (DUT). Scattering of data points were prominent in the 0-1 mA for feedback resistances larger or smaller than the DUT resistance.