A linear model for the thickness of superconducting Bi-2212 sedimentation films in relation to area density
Abstract
Two sets of Bi-2212 superconductor films, with TC−onset ranging from 75 K to 93 K, were synthesized via sedimentation, melt-quenching, and post-annealing. Cross-sectional images were taken for mean film thickness measurements. Plots of area density and thickness were superimposed with each other and an inverse-square relation with the dispersion radius (rD) was discovered. This behaviour was verified by the deposition probability (Pd) model. A strong positive linear correlation between area density and mean film thickness was also presented. A linear model along with its prediction intervals (68 % and 95 %) was made to predict resulting thicknesses of sedimentation films.
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