Development of photoconductive nitrogen-doped zinc oxide
Abstract
A nitrogen-doped zinc oxide (N:ZnO) photoconductor is successfully fabricated from a metal-semiconductor interface between an indium metal and N:ZnO thin films of varying at% N:Zn doping concentration. X-ray diffractometry (XRD) profile showed successful growth of thin films. The undoped thin flm had n-type conductivity while the doped thin films have p-type conductivity. Scanning electron microscopy (SEM) images of the thin films showed the effect of increasing doping concentration. Current-voltage(I-V) curves of the photoconductors indicated a photoresistive behavior. Resistivity measurements obtained from the I-V curves revealed that as doping concentration increases, resistivity decreases, and that the 10 at%
photoconductor had the lowest resistivity. Photoresponse curves of the 5 at% and 10 at% photoconductors showed an effective photoconductor that can react to light at varying frequencies.