I-V curves and flux creep activation energy in Y-doped Bi-2212 films

Abstract

The characteristic current-voltage (I-V) profiles and flux creep activation energy U-α were determined at different temperatures and applied magnetic fields to investigate flux pinning in Y-doped Bi-2212 films. The I-V curves exhibit a nonlinear behavior with temperature and magnetic field. The Anderson-Kim model was utilized to obtain the I dependence of the activation energy U-α which follows a logarithmic curve. Temperature and magnetic field suppressed I-V and U-α. Y addition however reduces resistive voltage and consequently increases U-α.