Thermo–optic coefficient of porous silicon

Authors

Lorenzo P. Lopez ⋅ PH Condensed Matter Physics Laboratory, National Institute of Physics, University of the Philippines, Diliman
Maria Angela B. Faustino ⋅ PH National Institute of Physics, University of the Philippines Diliman
Niel Gabriel E. Saplagio ⋅ PH National Institute of Physics, University of the Philippines Diliman
Arvin I. Mabilangan ⋅ PH National Institute of Physics, University of the Philippines, Diliman
Armando S. Somintac ⋅ PH National Institute of Physics, University of the Philippines Diliman

Abstract

Thermo-optic coefficients of porous silicon having the same thickness but different porosities have been calculated. Boron-doped silicon substrates have been electrochemically etched in a 12% HF solution at current densities 2.5mA/cm² and 15mA/cm² to fabricate ~1μm thick porous silicon. Temperature-dependent reflectance spectroscopy was performed to calculate the refractive index, porosity, and thermo-optic coefficient of the samples. Using the Bruggeman effective medium approximation formula, the calculated porosities of the samples were found to be 66.37% and 77.29% respectively. In the temperature range of 303.15K–484.15K, thermo-optic coefficients of -4.0x10^-4K^-1 and -3.0x10^-4K^-1 were obtained. Simulation data was also obtained using a Sellmeier fit to verify the reflectance spectra of porous silicon.

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Issue

2013: Proceedings of the 31st Samahang Pisika ng Pilipinas Physics Congress

Article ID

SPP2013-2A-2

Section

Materials Science

Published

2013-10-23

How to Cite

[1]

LP Lopez, MAB Faustino, NGE Saplagio, AI Mabilangan, and AS Somintac, Thermo–optic coefficient of porous silicon, Proceedings of the Samahang Pisika ng Pilipinas 31, SPP2013-2A-2 (2013). URL: https://proceedings.spp-online.org/article/view/SPP2013-2A-2.