VUV fluorescence from neodymium-doped fluorides using EUV-FEL

Authors

  • Nobuhiko Sarukura ⋅ JP Institute of Laser Engineering, Osaka University

Abstract

Nd3+:LaF3 and Nd3+:LuLiF4 crystals were excited by extreme ultraviolet (EUV)-FEL from the Spring-8 compact SASE source (SCSS) test accelerator in RIKEN. Time resolved photo-luminescence spectra were obtained using a VUV streak camera system. Nd3+:LaF3 has VUV emission at 172 nm while Nd3+:LuLiF3 emission was at 178 nm and 182 nm. The temporal profile of these peaks was found to have a slow component, aside from the well-established fast component. The fast component cannot be observed in the case of excitation by other light sources. These results show that EUV-FEL is a powerful tool for surveying materials with VUV emission.

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Issue

Article ID

SPP2012-PS-7

Section

Invited Presentations

Published

2012-10-22

How to Cite

[1]
N Sarukura, VUV fluorescence from neodymium-doped fluorides using EUV-FEL, Proceedings of the Samahang Pisika ng Pilipinas 30, SPP2012-PS-7 (2012). URL: https://proceedings.spp-online.org/article/view/SPP2012-PS-7.