Fabrication and characterization of zinc oxide thin films through spray pyrolysis technique
Abstract
Zinc Oxide (ZnO) thin films were deposited on P-type silicon (100) substrates using spray pyrolysis technique with varying substrate temperature and deposition time. X-ray diffraction (XRD) results showed that the crystallinity changes with substrate temperature. It also confirm that the film deposited at 300 0C has a hexagonal wurtzite structure with preferential orientation along (002) plane. The Scanning Electron Microscopy (SEM) images revealed that film has a continuous and dense structure and that varying the substrate temperature and the deposition time changes the surface morphology and thickness respectively.
Downloads
Published
Issue
Section
License
By submitting their manuscript to the Samahang Pisika ng Pilipinas (SPP) for consideration, the Authors warrant that their work is original, does not infringe on existing copyrights, and is not under active consideration for publication elsewhere.
Upon acceptance of their manuscript, the Authors further agree to grant SPP the non-exclusive, worldwide, and royalty-free rights to record, edit, copy, reproduce, publish, distribute, and use all or part of the manuscript for any purpose, in any media now existing or developed in the future, either individually or as part of a collection.
All other associated economic and moral rights as granted by the Intellectual Property Code of the Philippines are maintained by the Authors.