Pole figure mapping of GaAs/AlGaAs core-shell nanowires via high resolution x-ray diffraction
Abstract
This paper aims to demonstrate pole figure mapping as a structural characterization technique for gallium arsenide/aluminum gallium arsenide (GaAs/AlGaAs) core shell nanowires (NWs) using a high resolution x-ray diffractometer (HRXRD). The pole figure map was obtained by a series of azimuthal (φ) scans with varying sample orientation (Ɵ). Pole figure maps of NW samples grown on both Si (100) and Si (111) substrates were obtained. Plots showed dominance of zincblende (ZB) crystal structure for NWs grown on Si (100). Presence of both wurtzite (WZ) and ZB was also observed for NWs grown on Si (111). In addition to this, peaks attributed to twinning were also observed from the maps.