Electrical characterization of aluminum thin films on etched PCB substrate

Authors

  • Elvi Marie D. Dumayaca ⋅ PH Department of Physics, Ateneo de Manila University
  • Nico Miguel N. Garcia ⋅ PH Department of Physics, Ateneo de Manila University
  • Ivan B. Culaba ⋅ PH Department of Physics, Ateneo de Manila University

Abstract

Thermal evaporation in a vacuum is employed in the deposition of aluminum thin film on an etched PCB substrate using the Kinney Vacuum Coating System. The thin film’s resistance as a function of length was studied. The resistance was found to vary linearly with length. The sheet resistivity was measured using the 4-point probe. The resistivity value was 0.458 Ω-cm2. The thin film underwent SEM and AFM scanning. The scans showed that the coating had a porous surface morphology with thickness ranging from 0.3-1.9 μm. The thin film has a potential application as a variable resistor, strain gauge and gas sensor.

SPP 2012 Conference Proceedings cover

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Published

2012-10-22

Issue

2012: Proceedings of the 30th Samahang Pisika ng Pilipinas Physics Congress

Section

Condensed Matter Physics

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How to Cite

[1]
“Electrical characterization of aluminum thin films on etched PCB substrate”, Proc. SPP, vol. 30, no. 1, pp. SPP2012–6A, Oct. 2012, Accessed: Apr. 16, 2026. [Online]. Available: https://proceedings.spp-online.org/article/view/SPP2012-6A-5