Single cycle azimuthal dependence of the THz emission from GaAs on Si (100)
Abstract
We report on the azimuthal angle dependence of the terahertz (THz) emission from bulk GaAs, InAs and 1 μm thick GaAs thin film deposited on Si(100). All samples were studied in the reflection excitation geometry using a THz time-domain spectroscopy (TDS) setup. For the bulk GaAs and InAs samples, we have observed a two-fold azimuthal angle dependence. The results show that the relative contribution of the nonlinear optical rectification effect is higher in GaAs (14.3 %) than in InAs (9.65 %). We expect this since the second order nonlinear susceptibility of GaAs is higher than that of InAs. For the GaAs thin film, we have observed a single-cycle azimuthal angle dependence. In addition, the relative contribution for the GaAs thin film (28.9 %) doubled as compared to the bulk GaAs. We attribute this observation to twinning, which is highly probable in the film since GaAs and Si has a large lattice mismatch.