Fabrication of low reflectance porous silicon with gradient

Authors

  • J.M. Oxciano ⋅ PH Department of Physical Science, Polytechnic University of the Philippines Sta. Mesa
  • V.E. Malapit ⋅ PH Department of Physical Science, Polytechnic University of the Philippines Sta. Mesa
  • R. Ampoloquio ⋅ PH Department of Physical Science, Polytechnic University of the Philippines Sta. Mesa
  • A.I. Mabilangan ⋅ PH National Institute of Physics, University of the Philippines Diliman
  • N.G.E. Saplagio ⋅ PH National Institute of Physics, University of the Philippines Diliman
  • Rogelio Dizon ⋅ PH Department of Physical Science, Polytechnic University of the Philippines Sta. Mesa
  • Arnel Salvador ⋅ PH National Institute of Physics, University of the Philippines Diliman
  • Armando Somintac ⋅ PH National Institute of Physics, University of the Philippines Diliman

Abstract

Low reflectance porous silicon layers were fabricated using electrochemical etching in an ethanol-hydrofluoric acid solution at different time intervals and different anodic current densities. Layers with varying refractive indices were produced as the current density is changed during the etching process. The samples were characterized via Scanning Electron Microscope (SEM) and Optical Reflectivity. Minimum reflectivity of each sample was obtained from their corresponding reflectance spectra.

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Published

2011-10-24

How to Cite

[1]
J Oxciano, V Malapit, R Ampoloquio, A Mabilangan, N Saplagio, R Dizon, A Salvador, and A Somintac, Fabrication of low reflectance porous silicon with gradient, Proceedings of the Samahang Pisika ng Pilipinas 29, SPP2011-PB-26 (2011). URL: https://proceedings.spp-online.org/article/view/SPP2011-PB-26.