Surface morphological and electrical characterization of ZnO prepared by direct thermal oxidation
Abstract
Surface morphology and electrical properties of an oxidized zinc (Zn) metal foil were characterized by using an Atomic Force Microscope (AFM). The surface topographies of the Zn foil before and after oxidation were compared. The electric force microscopy (EFM) images show the effect of height variation and charge accumulation on the sample surface. This work demonstrates a non-invasive surface morphological and electrical characterization of zinc oxide (ZnO) prepared by direct thermal oxidation.
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