GaAs p-i(Multiple Quantum Well)-n on glass substrate by epitaxial lift-off for photovoltaic applications
Abstract
In this paper, we have successfully fabricated a GaAs p-i(MQW)-n on a glass substrate using epitaxial lift-off (ELO) process. Room temperature measurement of the current-voltage characteristic of the GaAs p-i(MQW)-n on glass substrate demonstrated diode ideality factor of 4.9, shunt resistance of 476,678 Ω and series resistance of 3,348 Ω with the latter obtained under dark condition. Photocurrent measurement showed a peak at 8400Å corresponding to the GaAs MQW inside the active region of the lifted-off sample on glass substrate indicating the effectiveness of the ELO process.