Resulting Thicknesses of Bi-2212 Superconducting sedimentation films in relation to the dispersion radius as deposition parameter: A statistical approach

Authors

  • Jan Isaac Bugante National Institute of Physics, University of the Philippines Diliman
  • Myles Allen Zosa School of Geography and the Environment, University of Oxford
  • Benjamin Villaflor National Institute of Physics, University of the Philippines Diliman
  • Roland Sarmago National Institute of Physics, University of the Philippines Diliman

Abstract

A single parameter model for ideal sedimentation-deposition case was made. This relates the dispersion radius (rd) with the mean thickness of the resulting
Bi-2212 films. Though randomness occurs in actual deposition, heat treatment via melting puts order to the thickness distribution within the films. It was found out that all samples except for FILM 2 in each set fits well with the proposed model.

SPP2011 Conference Proceedings Cover

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Published

2011-10-24

Issue

2011: Proceedings of the 29th Samahang Pisika ng Pilipinas National Physics Congress

Section

Condensed Matter and Materials Physics

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How to Cite

[1]
“Resulting Thicknesses of Bi-2212 Superconducting sedimentation films in relation to the dispersion radius as deposition parameter: A statistical approach”, Proc. SPP, vol. 29, no. 1, pp. SPP2011–1C, Oct. 2011, Accessed: Mar. 23, 2026. [Online]. Available: https://proceedings.spp-online.org/article/view/SPP2011-1C-3