Determining 2D emitter nanomaterial orientation via polarization analysis at oblique detection angle
Abstract
Optical emission processes, such as electroluminescence, are typically modeled by dipoles. Determining the nature and orientation of 2D dipole emitters is critical for numerous applications in optics and microscopy. CdSe/ZnS quantum dots, for instance, are widely used for applications such as LEDs and bioimaging due to their ideal structural properties. In some experimental setups involving microscopy, detection is often performed at an oblique angle relative to the substrate surface. However, theoretical models of dipole emission assume a normal detection angle. This discrepancy limits the spatial range for optical detection, making oblique angle detection crucial for comprehensive analysis. This study performs computational methods to characterize the emission properties of 2D dipoles at oblique detection angles, focusing on how optical microscopy substrates influence their behavior.
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