Determining the slit dimensions of a double-slit aperture through measuring laser diffraction intensity with a light-dependent resistor

Authors

Franchesca Mia R. Tortoza ⋅ PH Department of Physical Sciences, Polytechnic Unversity of the Philippines
Niña Zambale Simon ⋅ PH National Institute of Physics, University of the Philippines Diliman
Nathaniel Hermosa II ⋅ PH National Institute of Physics, University of the Philippines Diliman
Rhenish C. Simon ⋅ PH Physics Department, De La Salle University, Manila

Abstract

This paper demonstrates the possibility of measuring the intensity distribution of diffracted light using a light-dependent resistor. The resistor is first calibrated with respect to the light source, and the intensity of a diffraction pattern of a double-slit aperture is measured to create the intensity distribution. The primary and secondary minima of the intensity distribution are then used to calculate the width of the slits and the distance between the slits in the aperture, and these calculated values are compared to the dimensions of the slit. We find that the calculated values are highly accurate for the distance between the slits, but less accurate for the width of the slits.

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Issue

2024: Proceedings of the 42nd Samahang Pisika ng Pilipinas Physics Conference

Article ID

SPP-2024-PD-07

Section

Poster Session D (Photonics and Instrumentation Physics)

Published

2024-06-26

How to Cite

[1]

FMR Tortoza, N Simon, N Hermosa, and RC Simon, Determining the slit dimensions of a double-slit aperture through measuring laser diffraction intensity with a light-dependent resistor, Proceedings of the Samahang Pisika ng Pilipinas 42, SPP-2024-PD-07 (2024). URL: https://proceedings.spp-online.org/article/view/SPP-2024-PD-07.