Estimating the lattice constants from x-ray diffraction patterns in the presence of a zero-point shift

Authors

Maricar M. Rosete Department of Mining, Metallurgical and Materials Engineering, University of the Philippines Diliman
Adrian Vincent J. Tan Department of Mining, Metallurgical and Materials Engineering, University of the Philippines Diliman
Myles Allen H. Zosa National Institute of Physics, University of the Philippines Diliman

Abstract

X-ray diffraction (XRD) has been used in analyzing the crystal structure and composition of materials. The accuracy of this information is crucial for determining and understanding the material properties. However, detector miscalibrations arise from instrumental errors and lead to shifted XRD patterns. This limitation compromises the generated XRD data and subsequent analysis. In this study, we present a model to calculate the zero-point shift and the lattice parameters. The model was developed using multiple linear regression and elementary error analysis. We validated the model using simulated XRD data and showed that it can accurately calculate the lattice parameters in the presence of a zero-point shift. Our paper shows a practical and reliable means to estimate detector miscalibrations and improve the accuracy of XRD analysis.

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Issue

2023: Proceedings of the 41st Samahang Pisika ng Pilipinas Physics Conference

Article ID

SPP-2023-PA-22

Section

Poster Session A (Materials Science, Instrumentation, and Photonics)

Published

2023-07-11

How to Cite

[1]

MM Rosete, AVJ Tan, and MAH Zosa, Estimating the lattice constants from x-ray diffraction patterns in the presence of a zero-point shift, Proceedings of the Samahang Pisika ng Pilipinas 41, SPP-2023-PA-22 (2023). URL: https://proceedings.spp-online.org/article/view/SPP-2023-PA-22.