Fourier transform infrared spectoscopy of Nd:YAG thin films by fs-PLD with nitrogen and oxygen as background gas

Authors

  • Joy Kristelle Candelaria De Mata Materials Science and Engineering Program, University of the Philippines Diliman
  • Wilson Garcia National Institute of Physics, University of the Philippines Diliman
  • Lean Dasallas Materials Science and Engineering Program, University of the Philippines Diliman

Abstract

Nd:YAG is a synthetic laser crystal that possesses favorable properties such as high optical transparency in this study. Nd:YAG thin film was deposited on a glass substrate using a femtosecond pulsed laser deposition technique under the influence of nitrogen and oxygen background gases. The target to substrate distance was 2 mm. The deposition was conducted with background pressures of 50 and 80 mTorr. Deposited films were characterized using FTIR. Film deposited under the influence of oxygen yielded lower transmittance which could be due to increase surface roughness. Interaction between ablated materials and oxygen resulted to sputtering. The increase of nitrogen gas pressure also produced a rougher film, hence, lower transmittance.

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Published

2020-10-19

How to Cite

[1]
JKC De Mata, W Garcia, and L Dasallas, Fourier transform infrared spectoscopy of Nd:YAG thin films by fs-PLD with nitrogen and oxygen as background gas, Proceedings of the Samahang Pisika ng Pilipinas 38, SPP-2020-4F-04 (2020). URL: https://proceedings.spp-online.org/article/view/SPP-2020-4F-04.

Issue

Section

Condensed Matter and Materials Science