Nanoscale contact charging of MoS₂ by atomic force microscope

Authors

  • Jose Manuel Esmeria, Jr. Central Instrumentation Facility, De La Salle University-Laguna Campus
  • Terencio D Lacuesta Institute of Mathematical Sciences and Physics, University of the Philippines Los Baños
  • Romeric F Pobre Physics Department, De La Salle University, Manila

Abstract

Contact Electrification of MoS2 at nanometer level was demonstrated using a tapping mode Atomic Force Microscope or AFM. A highly doped n-type Si tip, d.c. biased from 0 to ±2 V with a resonant frequency of 300 kHz and a fixed amplitude set-point amplitude of 20 nm, was used to generate contact electrification on the surface of 5 mm x 3 mm MoS2 sample. Using the Kelvin Probe Force Microscope or KPFM, the surface potential images were shown to have bipolar charging and the surface charge affinity is more influenced by the positive bias voltage.

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Published

2020-10-19

How to Cite

[1]
JM Esmeria, TD Lacuesta, and RF Pobre, Nanoscale contact charging of MoS₂ by atomic force microscope, Proceedings of the Samahang Pisika ng Pilipinas 38, SPP-2020-3A-03 (2020). URL: https://proceedings.spp-online.org/article/view/SPP-2020-3A-03.

Issue

Section

Condensed Matter and Materials Science (Short Presentations)