Reflectivity of textured GaAs modeled as graded index film
Abstract
We measure the reflectivity of the textured GaAs surface to confirm if it possesses the optical properties of a graded index layer. Using the cross section micrographs of the textured sample, we measured its texture thickness and use it as the length of the graded index region. Experimental reflectivity measurements exhibit a good match to that of the numerical simulations for a graded index thin film.
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From laboratory to society: Physics in nation building
29 May-1 June 2019, Tagbilaran City
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