Effects of film thickness on the electrochemical performance of copper oxide electrode

Abstract

Copper oxide electrodes with different thicknesses were deposited on stainless steel substrates using spray pyrolysis technique and were subsequently annealed at 400°C for two hours. The x-ray diffraction, XRD, revealed that only CuO phase exist on the fabricated electrode. A highest specific capacitance, C_s, of 182.6 F/g was recorded on the thickest electrode which is attributed to the electrode's low resistance of charge diffusion into the electrode material, 56.41Ω. The electrode owes its low charge transfer resistance to its large grain size revealed by scanning electron microscopy.