Comparison of sensitivity between reflectivity and angular Goos-Hänchen shift measurements in determining the thickness of CuO film on Cu substrate

Authors

Cherrie May Mogueis Olaya ⋅ PH National Institute of Physics, University of the Philippines Diliman
Jenny Lou Balbuena Sagisi ⋅ PH National Institute of Physics, University of the Philippines Diliman
Nathaniel Placido Hermosa, II ⋅ PH National Institute of Physics, University of the Philippines Diliman

Abstract

We compare the sensitivity of measuring the reflectivity and angular Goos-Hänchen Θ_GH shift to determine CuO film thickness on a Cu substrate. Calculation of the response of the detectors used in reflectivity and beamshift measurements showed the capability of both techniques in measuring film thickness less than 8 nm. Our results showed that the response of a photodiode in reflectivity measurements is three orders of magnitude more sensitive than using a quadrant detector (QD) for beamshift measurements.

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Issue

2018: Proceedings of the 36th Samahang Pisika ng Pilipinas Physics Conference

Article ID

SPP-2018-PA-34

Section

Poster Session A (Materials Science, Instrumentation, and Photonics)

Published

2018-05-29

How to Cite

[1]

CMM Olaya, JLB Sagisi, and NP Hermosa, Comparison of sensitivity between reflectivity and angular Goos-Hänchen shift measurements in determining the thickness of CuO film on Cu substrate, Proceedings of the Samahang Pisika ng Pilipinas 36, SPP-2018-PA-34 (2018). URL: https://proceedings.spp-online.org/article/view/SPP-2018-PA-34.