Optical and electrical characterization of an interdigitated structured metal-semiconductor photodiode fabricated on n-GaAs substrate
Abstract
A metal-semiconductor photodiode with interdigitated finger structure was successfully fabricated and characterized. The metal used for the schottky contact was Ti/Au and the substrate semiconductor was an ndoped GaAs. The turn-on voltage of the photodiode was 0.2 V while the breakdown voltage was -0.5 V. The relatively low measured values were attributed to the high doping concentration of the substrate. Photocurrent generation started at 1.4 eV which approximately corresponds to the GaAs energy bandgap.