Photoluminescence spectra of chemically oxidized nanoporous silicon
Abstract
Room temperature photoluminescence (PL) spectroscopy was performed on freshly prepared and chemically oxidized nanocrystalline porous silicon (Si) derived from n-type (100) Si. The PL peak was shifted by about 0.03 eV for the sample oxidized up to 30 minutes. The shifting was accompanied by the narrowing of the full width half maximum and decrease in PL intensity. The observed changes in the PL spectra were attributed to the reduction of radiative surface statesĀ in the porous Si layer.