Micromanipulation of ZnO microrods using an Atomic Force Microscope

Authors

Alexandra B. Santos National Institute of Physics, University of the Philippines Diliman and Institute of Mathematical Sciences and Physics, University of the Philippines Los Baños
Bess G. Singidas National Institute of Physics, University of the Philippines Diliman
Roland V. Sarmago National Institute of Physics, University of the Philippines Diliman

Abstract

ZnO rods are mechanically positioned on desired places using the semicontact mode of the AFM. During the micromanipulation process, we turned off the feedback system, moved the probe using the probe of the x,y,z scanner control while monitoring the oscillation of the cantilever. The z component of the force exerted during the manipulation is stronger compared to the force used in semicontact mode imaging. This study shows that micron-sized ZnO rods, grown using Aqueous Chemical Growth (ACG), can be manipulated without damaging the structures. This could further lead to positioning of ZnO structures on prefabricated contacts and be used in characterization of ZnO.

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Issue

2010: Proceedings of the 28th Samahang Pisika ng Pilipinas Physics Congress

Article ID

SPP-2010-3A-01

Section

Materials Physics

Published

2010-10-25

How to Cite

[1]

AB Santos, BG Singidas, and RV Sarmago, Micromanipulation of ZnO microrods using an Atomic Force Microscope, Proceedings of the Samahang Pisika ng Pilipinas 28, SPP-2010-3A-01 (2010). URL: https://proceedings.spp-online.org/article/view/SPP-2010-3A-01.