Synthesis of aluminum nitride via reactive RF-magnetron sputtering using low RF-power at deposition
Abstract
Aluminum Nitride (AlN) thin film has found several applications in radio frequency micro-electromechanical systems (RF-MEMS) and optoelectronicdevices. In this study, AlN was synthesized using reactive radio frequency (rf) magnetron sputtering at an rf-power of 70W without intentional substrate heating. Sputtering gas used was argon and nitrogen mixture having a partial pressure ratio of 1:3, respectively. Aluminum to nitrogen stoichiometry was close to 1:1 as observed using EDS. Via XRD, the synthesized AlN film was found to be amorphous. The grown films did not exhibit porosity as depicted in SEM micrographs. UV-VIS spectrometry of the film showed absorbance atabout 396 nm (3.13 eV), 290 nm (4.28 eV) and 230 nm (5.39 eV).
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